Mountains® surface analysis software at Pittcon 2021

One software program for all your measured data

Mountains® software helps the industrial and scientific community visualize, analyze and report on data obtained with a wide range of instruments, including Scanning Electron Microscopes (SEM), Atomic Force Microscopes (AFM), other Scanning Probe Microscopes (SPM), spectroscopic techniques such as EDX/EDS, Raman, FT-IR etc., 2D and 3D profilers/microscopes.

Process data from any surface measuring instrument all in one place:

SEM images including EDX/EDS data
AFM & other SPM images
Spectral data from Raman, fluorescence, IR, XPS, cathodoluminescence etc.
2D profiles or 3D surface heights

Integrated by leading instrument manufacturers worldwide, embedded in their equipment or available as an option, Mountains® software has become the industry standard for studying micro and nano surfaces.

Learn more about Mountains® software key features in our video presentation:

See example applications:

	Correlating AFM, SEM & EDX data for nanoparticle analysis Mountains^® sofware used to combined measurements from several instrument techniques including AFM, SEM and EDX. => Learn more
	Exploring hyperspectral maps of 2D materials Hyperspectral maps and advanced principal component analysis (PCA) were performed with Mountains^® software. => Learn more
	Analyzing photoelectron spectroscopic measurements Mountains^® software combined with photoelectron spectroscopy to investigate a new method for growing PbS nanoplatelets on InP surfaces. => Learn more
	Characterizing the silicon dangling bond Research scientists used Mountains^® software to understand the electronic properties of silicon dangling bonds. => Learn more
	Failure analysis in optoelectronic devices Quantitative CL technology coupled with Mountains® software makes it possible to identify degraded layers in green laser diodes. => Learn more